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ds323x-rs
mirror of https://github.com/eldruin/ds323x-rs
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Split tests into modules

pull/4/head
Diego Barrios Romero 2018-10-28 11:52:07 +01:00
parent e5ff811c59
commit 4d105bf11e
6 changed files with 113 additions and 95 deletions
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96
src/lib.rs
View File

@ -176,7 +176,7 @@ struct Register;
impl Register {
const SECONDS : u8 = 0x00;
}
}
const DEVICE_ADDRESS: u8 = 0b110_1000;
@ -262,97 +262,3 @@ where
}
mod ds323x;
#[cfg(test)]
mod tests {
use super::*;
extern crate embedded_hal_mock as hal;
extern crate std;
use self::std::vec;
struct DummyOutputPin;
impl embedded_hal::digital::OutputPin for DummyOutputPin {
fn set_low(&mut self) {}
fn set_high(&mut self) {}
}
mod ds3231 {
use super::*;
#[test]
fn can_create() {
Ds323x::new_ds3231(hal::i2c::Mock::new(&[]));
}
#[test]
fn can_get_seconds() {
let transactions = [
hal::i2c::Transaction::write_read(DEVICE_ADDRESS, vec![Register::SECONDS], vec![1])
];
let mut dev = Ds323x::new_ds3231(hal::i2c::Mock::new(&transactions));
assert_eq!(1, dev.get_seconds().unwrap());
}
#[test]
fn can_set_seconds() {
let transactions = [
hal::i2c::Transaction::write(DEVICE_ADDRESS, vec![Register::SECONDS, 1])
];
let mut dev = Ds323x::new_ds3231(hal::i2c::Mock::new(&transactions));
dev.set_seconds(1).unwrap();
}
}
mod ds3232 {
use super::*;
#[test]
fn can_create() {
Ds323x::new_ds3232(hal::i2c::Mock::new(&[]));
}
#[test]
fn can_get_seconds() {
let transactions = [
hal::i2c::Transaction::write_read(DEVICE_ADDRESS, vec![Register::SECONDS], vec![1])
];
let mut dev = Ds323x::new_ds3232(hal::i2c::Mock::new(&transactions));
assert_eq!(1, dev.get_seconds().unwrap());
}
#[test]
fn can_set_seconds() {
let transactions = [
hal::i2c::Transaction::write(DEVICE_ADDRESS, vec![Register::SECONDS, 1])
];
let mut dev = Ds323x::new_ds3232(hal::i2c::Mock::new(&transactions));
dev.set_seconds(1).unwrap();
}
}
mod ds3234 {
use super::*;
#[test]
fn can_create() {
Ds323x::new_ds3234(hal::spi::Mock::new(&[]), DummyOutputPin);
}
#[test]
fn can_get_seconds() {
let transactions = [
hal::spi::Transaction::transfer(vec![Register::SECONDS, 0], vec![Register::SECONDS, 1])
];
let mut dev = Ds323x::new_ds3234(hal::spi::Mock::new(&transactions), DummyOutputPin);
assert_eq!(1, dev.get_seconds().unwrap());
}
#[test]
fn can_set_seconds() {
let transactions = [
hal::spi::Transaction::write(vec![Register::SECONDS + 0x80, 1])
];
let mut dev = Ds323x::new_ds3234(hal::spi::Mock::new(&transactions), DummyOutputPin);
dev.set_seconds(1).unwrap();
}
}
}

16
tests/common/mod.rs 100644
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@ -0,0 +1,16 @@
extern crate embedded_hal;
pub const DEVICE_ADDRESS: u8 = 0b110_1000;
pub struct Register;
impl Register {
pub const SECONDS : u8 = 0x00;
}
pub struct DummyOutputPin;
impl embedded_hal::digital::OutputPin for DummyOutputPin {
fn set_low(&mut self) {}
fn set_high(&mut self) {}
}

11
tests/ds3231.rs 100644
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@ -0,0 +1,11 @@
extern crate embedded_hal_mock as hal;
extern crate ds323x;
use ds323x::Ds323x;
#[test]
fn can_create_and_destroy() {
let dev = Ds323x::new_ds3231(hal::i2c::Mock::new(&[]));
let mut i2c = dev.destroy_ds3231();
i2c.done();
}

11
tests/ds3232.rs 100644
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@ -0,0 +1,11 @@
extern crate embedded_hal_mock as hal;
extern crate ds323x;
use ds323x::Ds323x;
#[test]
fn can_create_and_destroy() {
let dev = Ds323x::new_ds3232(hal::i2c::Mock::new(&[]));
let mut i2c = dev.destroy_ds3232();
i2c.done();
}

13
tests/ds3234.rs 100644
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@ -0,0 +1,13 @@
extern crate embedded_hal_mock as hal;
extern crate ds323x;
use ds323x::Ds323x;
mod common;
use common::DummyOutputPin;
#[test]
fn can_create_and_destroy() {
let dev = Ds323x::new_ds3234(hal::spi::Mock::new(&[]), DummyOutputPin);
let (mut spi, _cs) = dev.destroy_ds3234();
spi.done();
}

61
tests/ds323x.rs 100644
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@ -0,0 +1,61 @@
extern crate embedded_hal_mock as hal;
extern crate ds323x;
use ds323x::{ Ds323x, interface, ic };
use hal::i2c::{ Mock as I2cMock, Transaction as I2cTrans };
use hal::spi::{ Mock as SpiMock, Transaction as SpiTrans };
mod common;
use common::{ DEVICE_ADDRESS, Register, DummyOutputPin };
fn new_ds3231(transactions: &[I2cTrans]) -> Ds323x<interface::I2cInterface<I2cMock>, ic::DS3231> {
Ds323x::new_ds3231(I2cMock::new(&transactions))
}
fn new_ds3232(transactions: &[I2cTrans]) -> Ds323x<interface::I2cInterface<I2cMock>, ic::DS3232> {
Ds323x::new_ds3232(I2cMock::new(&transactions))
}
fn new_ds3234(transactions: &[SpiTrans])
-> Ds323x<interface::SpiInterface<SpiMock, DummyOutputPin>, ic::DS3234> {
Ds323x::new_ds3234(SpiMock::new(&transactions), DummyOutputPin)
}
macro_rules! get_test {
($name:ident, $method:ident, $create_method:ident, $expected:expr, $transaction:expr) => {
#[test]
fn $name() {
let transactions = [ $transaction ];
let mut dev = $create_method(&transactions);
assert_eq!($expected, dev.$method().unwrap());
}
};
}
macro_rules! set_test {
($name:ident, $method:ident, $create_method:ident, $value:expr, $transaction:expr) => {
#[test]
fn $name() {
let transactions = [ $transaction ];
let mut dev = $create_method(&transactions);
dev.$method($value).unwrap();
}
};
}
get_test!(can_get_seconds_ds3231, get_seconds, new_ds3231, 1,
I2cTrans::write_read(DEVICE_ADDRESS, vec![Register::SECONDS], vec![1]));
get_test!(can_get_seconds_ds3232, get_seconds, new_ds3232, 1,
I2cTrans::write_read(DEVICE_ADDRESS, vec![Register::SECONDS], vec![1]));
get_test!(can_get_seconds_ds3234, get_seconds, new_ds3234, 1,
SpiTrans::transfer(vec![Register::SECONDS, 0], vec![Register::SECONDS, 1]));
set_test!(can_set_seconds_ds3231, set_seconds, new_ds3231, 1,
I2cTrans::write(DEVICE_ADDRESS, vec![Register::SECONDS, 1]));
set_test!(can_set_seconds_ds3232, set_seconds, new_ds3232, 1,
I2cTrans::write(DEVICE_ADDRESS, vec![Register::SECONDS, 1]));
set_test!(can_set_seconds_ds3234, set_seconds, new_ds3234, 1,
SpiTrans::write(vec![Register::SECONDS + 0x80, 1]));