Separate exclusive tests

tests/ds3232.rs

@@ -0,0 +1,12 @@
+#[deny(warnings)]
+
+extern crate embedded_hal_mock as hal;
+extern crate ds323x;
+use ds323x::Ds323x;
+
+#[test]
+fn can_create_and_destroy() {
+    let dev = Ds323x::new_ds3232(hal::i2c::Mock::new(&[]));
+    let mut i2c = dev.destroy_ds3232();
+    i2c.done();
+}

tests/ds3232_4.rs

@@ -45,18 +45,6 @@ macro_rules! set_param_test_2_4 {
     };
 }
 
-#[test]
-fn can_create_and_destroy_ds3232() {
-    let dev = new_ds3232(&[]);
-    destroy_ds3232(dev);
-}
-
-#[test]
-fn can_create_and_destroy_ds3234() {
-    let dev = new_ds3234(&[]);
-    destroy_ds3234(dev);
-}
-
 const DEFAULT_WRITE_STATUS: u8 = DS323X_POR_STATUS | BF::ALARM2F | BF::ALARM1F;
 
 call_method_status_test!(can_en_32khz_bat, enable_32khz_output_on_battery,

tests/ds3234.rs

@@ -0,0 +1,14 @@
+#[deny(warnings)]
+
+extern crate embedded_hal_mock as hal;
+extern crate ds323x;
+
+#[allow(unused)]
+mod common;
+use common::{ new_ds3234, destroy_ds3234 };
+
+#[test]
+fn can_create_and_destroy_ds3234() {
+    let dev = new_ds3234(&[]);
+    destroy_ds3234(dev);
+}